ToF-SIMS specialist

I am researcher specialized in surface and interface characterization using secondary ion mass spectrometry (SIMS).

What does that mean ? This means that I am knowledge discoverer pushing back the boundaries of surface and interface science. To achieve this goal, I aim at exploring the intricacies of material analysis at the molecular level using secondary ion mass spectrometry. Getting a deeper understanding of surfaces and interfaces at the molecular level is one step to address different challenges, such as the development of new materials for every kind of applications, but also unraveling biological phenomena.

But why ? Science is a world still full of mysteries to be unraveled and understood. This makes research a thrilling work environment on many levels. Firstly on an intellectual level, we are challenged every day in our way of understanding our surroundings. Secondly, on a social level, we have unique possibilities to meet fellow scientists and exchange about our discoveries but also our different cultures.

What is ToF-SIMS ?

ToF-SIMS stands for Time of Flight Secondary Ion Mass Spectrometry. The principle is very easy. The surface of a sample is bombarded by primary ions, which will generate secondary ions along neutral fragments, electrons and photons. These secondary ions are extracted and accelerated towards a detector. As all ions are accelerated with the same energy, but have the different masses, they can be separated by the time they land on the detector. So, by measuring the time of flight of these ions, the mass of the ions can be determined (see the video below).

This technique allows to get insightful chemical information of surfaces, or interfaces and bulk of materials by depth profiling. It is a very sensitive technique able to detect traces of chemicals on surfaces, while sensing only a few nanometers in depth. The lateral resolution depends on the type of equipment used but is in the tenth of nanometers.