It is a great a pleasure to announce the publication of our latest article about the use of matrices in ToF-SIMS to analyze OLED molecules. The main conclusion of the article is that the ion yield can be enhanced just by spraying solvent on the surfaces to analyze. This opens new opportunities for material characterization. Indeed, spraying solvent is a fast, easy, and cheap methodology, hence easily transferable to many different samples. It also presents the advantage to limit the risk of mass interferences in the spectra, as the solvent evaporates before the measurements. The article also shows the investigation of the surface modification induced by the spraying of matrices/solvents on the surface topography.
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